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ISQED
2007
IEEE
148views Hardware» more  ISQED 2007»
14 years 1 days ago
On Accelerating Soft-Error Detection by Targeted Pattern Generation
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
14 years 2 days ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
GLOBECOM
2006
IEEE
13 years 11 months ago
Cyclic Codes Tailored to a Known Set of Error Patterns
— We propose a high-rate error-pattern control code based on a generator polynomial targeting a specific set of known dominant error patterns. This code is based on first const...
Jihoon Park, Jaekyun Moon
AIPR
2005
IEEE
13 years 11 months ago
Hyperspectral Detection Algorithms: Operational, Next Generation, on the Horizon
Abstract—The multi-band target detection algorithms implemented in hyperspectral imaging systems represent perhaps the most successful example of image fusion. A core suite of su...
A. Schaum
ATS
2003
IEEE
105views Hardware» more  ATS 2003»
13 years 11 months ago
Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. R...