17 search results - page 1 / 4 » On Compacting Test Response Data Containing Unknown Values |
ICCAD
2003
IEEE
13 years 10 months ago
2003
IEEE
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature R...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper proposes a response compactor, named ChiYun compactor, to compact scan-out responses in the presence of unknown values. By adding storage elements into an Xor network, ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...