51 search results - page 4 / 11 » On Programmable Memory Built-In Self Test Architectures |
VTS
1995
IEEE
13 years 9 months ago
1995
IEEE
In this paper, we propose an entirely new Built-In Self Test scheme for high-level synthesis of data path architectures that makes use of the arithmetic blocks in the data path to...
ITC
1997
IEEE
13 years 10 months ago
1997
IEEE
: Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance....
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...
MTDT
2000
IEEE
13 years 10 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
CSREAESA
2009
13 years 6 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...