123 search results - page 25 / 25 » On Statistical Timing Analysis with Inter- and Intra-Die Var... |
CIVR
2005
Springer
13 years 11 months ago
2005
Springer
In the paper, we proposed a novel feature descriptor using over-complete wavelet transform and wavelet domain based fractal signature for texture image analysis and retrieval. Trad...
VLSID
2005
IEEE
14 years 6 months ago
2005
IEEE
Abstract--Power analysis early in the design cycle is critical for the design of lowpower systems. With the move to system-level specifications and design methodologies, there has ...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...