36 search results - page 2 / 8 » On Testing the Path Delay Faults of a Microprocessor Using i... |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
The first non-enumerative framework for diagnosing path delay faults using zero suppressed binary decision diagrams is introduced. We show that fault free path delay faults with ...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
ASPDAC
2004
ACM
13 years 10 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...