36 search results - page 4 / 8 » On Testing the Path Delay Faults of a Microprocessor Using i... |
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
ISCAS
2006
IEEE
14 years 5 days ago
2006
IEEE
— Bit and subword permutations are useful in many multimedia and cryptographic applications. New shift and permute instructions have been added to the instruction set of general-...
DAC
2002
ACM
14 years 7 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
DAC
2006
ACM
13 years 8 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
DATE
2000
IEEE
13 years 10 months ago
2000
IEEE
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...