187 search results - page 3 / 38 » On Using Efficient Test Sequences for BIST |
CORR
2010
Springer
13 years 2 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
ASPDAC
2000
ACM
13 years 9 months ago
2000
ACM
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
VLSID
2005
IEEE
13 years 11 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...