42 search results - page 3 / 9 » On primitive fault test generation in non-scan sequential ci... |
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
DSD
2007
IEEE
14 years 2 days ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
ET
2000
13 years 5 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
ICCAD
1998
IEEE
13 years 10 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...