14 search results - page 2 / 3 » On reducing both shift and capture power for scan-based test... |
DATE
2009
IEEE
14 years 27 days ago
2009
IEEE
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-...
DATE
2010
IEEE
13 years 8 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
TC
2008
13 years 6 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
FGR
2000
IEEE
13 years 10 months ago
2000
IEEE
Human motion capture has lately been the object of much attention due to commercial interests. A ”touch free” computer vision solution to the problem is desirable to avoid the...