21 search results - page 4 / 5 » On the analysis of digital circuits with uncertain inputs |
ITC
1997
IEEE
13 years 10 months ago
1997
IEEE
- An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two metho...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ASPDAC
2006
ACM
14 years 2 hour ago
2006
ACM
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
RSP
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper describes the early analysis and estimation features currently implemented in the Berkeley Emulation Engine (BEE) system. BEE is an integrated rapid prototyping and des...
FPGA
2005
ACM
13 years 11 months ago
2005
ACM
Floating-point Sparse Matrix-Vector Multiplication (SpMXV) is a key computational kernel in scientific and engineering applications. The poor data locality of sparse matrices sig...