43 search results - page 9 / 9 » Optimal Supply and Threshold Scaling for Subthreshold CMOS C... |
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
DATE
2009
IEEE
13 years 8 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
CASES
2006
ACM
13 years 11 months ago
2006
ACM
Rising interest in the applications of wireless sensor networks has spurred research in the development of computing systems for lowthroughput, energy-constrained applications. Un...