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» Optimal Testing of Reed-Muller Codes
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GLVLSI
2002
IEEE
160views VLSI» more  GLVLSI 2002»
13 years 10 months ago
Computing walsh, arithmetic, and reed-muller spectral decision diagrams using graph transformations
Spectral techniques have found many applications in computeraided design, including synthesis, verification, and testing. Decision diagram representations permit spectral coeffici...
Whitney J. Townsend, Mitchell A. Thornton, Rolf Dr...
STOC
2007
ACM
111views Algorithms» more  STOC 2007»
14 years 6 months ago
Low-end uniform hardness vs. randomness tradeoffs for AM
In 1998, Impagliazzo and Wigderson [IW98] proved a hardness vs. randomness tradeoff for BPP in the uniform setting, which was subsequently extended to give optimal tradeoffs for t...
Ronen Shaltiel, Christopher Umans
DFT
2004
IEEE
94views VLSI» more  DFT 2004»
13 years 9 months ago
Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
WCE
2007
13 years 6 months ago
OptiTest: Optimizing Test Case Using Hybrid Intelligence
This paper deals with the identification of best and optimized test cases in program components and software artifacts. Our purpose is to simulate the model on a sample software pr...
Mohammed Al-Fayoumi, Prabhat Mahanti, Soumya Baner...
DATE
2005
IEEE
172views Hardware» more  DATE 2005»
13 years 11 months ago
Evolutionary Optimization in Code-Based Test Compression
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
Ilia Polian, Alejandro Czutro, Bernd Becker