257 search results - page 1 / 52 » Packet-Based Input Test Data Compression Techniques |
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...
ET
2002
13 years 4 months ago
2002
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...