In this paper, we present a new pseudo-random sequence generator, constructed by the generalized discrete Baker transformation. This new generator is called Cascaded Baker Register...
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
Patrick Girard, Christian Landrault, Serge Pravoss...
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
Abstract. The need of true random number generators for many purposes (ranging from applications in cryptography and stochastic simulation, to search heuristics and game playing) i...