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GLVLSI
2006
IEEE
144views VLSI» more  GLVLSI 2006»
13 years 11 months ago
Crosstalk analysis in nanometer technologies
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
Shahin Nazarian, Ali Iranli, Massoud Pedram
ISQED
2007
IEEE
150views Hardware» more  ISQED 2007»
13 years 11 months ago
A Design Methodology for Matching Improvement in Bandgap References
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
Juan Pablo Martinez Brito, Hamilton Klimach, Sergi...
MJ
2008
67views more  MJ 2008»
13 years 5 months ago
Temperature-adaptive voltage tuning for enhanced energy efficiency in ultra-low-voltage circuits
Circuits optimized for minimum energy consumption operate typically in the subthreshold regime with ultra-low power-supply voltages. Speed of a subthreshold logic circuit is enhan...
Ranjith Kumar, Volkan Kursun
DT
2006
109views more  DT 2006»
13 years 5 months ago
Test Consideration for Nanometer-Scale CMOS Circuits
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng
ICCAD
2004
IEEE
147views Hardware» more  ICCAD 2004»
14 years 2 months ago
Interval-valued reduced order statistical interconnect modeling
9, IO]. However, unlike the case with static timing, it is not so easy We show how recent advances in the handling of correlated interval representations of range uncertainty can b...
James D. Ma, Rob A. Rutenbar