35 search results - page 1 / 7 » Parametric yield estimation considering leakage variability |
DAC
2004
ACM
13 years 10 months ago
2004
ACM
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches ...
TCAD
2008
13 years 4 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...