35 search results - page 3 / 7 » Parametric yield estimation considering leakage variability |
DAGM
2010
Springer
13 years 6 months ago
2010
Springer
Density modeling is notoriously difficult for high dimensional data. One approach to the problem is to search for a lower dimensional manifold which captures the main characteristi...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
- Advanced process technologies impose more significant challenges especially when manufactured circuits exhibit substantial process variations. Consideration of process variations...
TCAD
2008
13 years 5 months ago
2008
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
VLSID
2009
IEEE
14 years 6 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
MA
2010
Springer
13 years 4 months ago
2010
Springer
: Semiparametric linear transformation models have received much attention due to its high flexibility in modeling survival data. A useful estimating equation procedure was recent...