5799 search results - page 2 / 1160 » Patterns Generate Architectures |
DAC
1999
ACM
14 years 6 months ago
1999
ACM
ICCAD
1994
IEEE
13 years 9 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
DAC
1997
ACM
13 years 9 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
TC
2008
13 years 5 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
EUPROJECTS
2006
Springer
13 years 9 months ago
2006
Springer
The mobile user can interact with devices in the environment using either the devices themselves or a device she carries with her. This requires an adaption of the user interface t...