5799 search results - page 3 / 1160 » Patterns Generate Architectures |
AR
2008
13 years 5 months ago
2008
In this paper we describe the use of design patterns as a basis for creating a Humanoid Walking Pattern Generator Software having a modular architecture. This architecture made po...
AOSD
2007
ACM
13 years 9 months ago
2007
ACM
Developing and debugging parallel programs particularly for distributed memory architectures is still a difficult task. The most popular approach to developing parallel programs f...
DAC
1997
ACM
13 years 10 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
DAC
2003
ACM
13 years 11 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
VLSID
2002
IEEE
14 years 6 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...