46 search results - page 1 / 10 » Process variation aware cache leakage management |
ISLPED
2006
ACM
13 years 11 months ago
2006
ACM
In a few technology generations, limitations of fabrication processes will make accurate design time power estimates a daunting challenge. Static leakage current which comprises a...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
On-chip caches take a large portion of the chip area. They are much more vulnerable to parameter variation than smaller units. As leakage current becomes a significant component ...
ISVLSI
2008
IEEE
13 years 11 months ago
2008
IEEE
The share of leakage in cache power consumption increases with technology scaling. Choosing a higher threshold voltage (Vth) and/or gate-oxide thickness (Tox) for cache transistor...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Technology scaling has resulted in an exponential increase in the leakage power as well as the variations in leakage power of fabricated chips. Functional units (FUs), like Intege...