124 search results - page 1 / 25 » Progressive Bridge Identification |
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...
ICCD
1999
IEEE
13 years 8 months ago
1999
IEEE
High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at det...
ASPDAC
2001
ACM
13 years 8 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
ACL
2006
13 years 5 months ago
2006
Recent developments in statistical modeling of various linguistic phenomena have shown that additional features give consistent performance improvements. Quite often, improvements...
IMCSIT
2010
13 years 2 months ago
2010
In this paper we discuss the problem of building the Polish lexicon for the Cyc ontology. As the ontology is very large and complex we describe semi-automatic translation of part o...