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TVLSI
2008
133views more  TVLSI 2008»
13 years 5 months ago
Test Data Compression Using Selective Encoding of Scan Slices
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
Zhanglei Wang, Krishnendu Chakrabarty
INTEGRATION
1998
96views more  INTEGRATION 1998»
13 years 5 months ago
BIST for systems-on-a-chip
An increasing part of microelectronic systems is implemented on the basis of predesigned and preverified modules, so-called cores, which are reused in many instances. Core-provide...
Hans-Joachim Wunderlich
DFT
2007
IEEE
123views VLSI» more  DFT 2007»
13 years 11 months ago
Checker Design for On-line Testing of Xilinx FPGA Communication Protocols
In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemen...
Martin Straka, Jiri Tobola, Zdenek Kotásek
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
13 years 10 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
CAI
2004
Springer
13 years 5 months ago
An Evolvable Combinational Unit for FPGAs
A complete hardware implementation of an evolvable combinational unit for FPGAs is presented. The proposed combinational unit consisting of a virtual reconfigurable circuit and evo...
Lukás Sekanina, Stepan Friedl