8 search results - page 1 / 2 » Pseudorandom functional BIST for linear and nonlinear MEMS |
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics dom...
IPL
2000
13 years 4 months ago
2000
We obtain an exponential lower bound on the non-linear complexity of the new pseudo-random function, introduced recently by M. Naor and O. Reingold. This bound is an extension of t...
ITC
1996
IEEE
13 years 8 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
ITC
2000
IEEE
13 years 8 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ISCAS
2008
IEEE
13 years 11 months ago
2008
IEEE
— The lack of robust tamper-proofing techniques in security applications has provided attackers the ability to virtually circumvent mathematically strong cryptographic primitive...