31 search results - page 5 / 7 » Quality considerations in delay fault testing |
ICSE
2009
IEEE-ACM
14 years 16 days ago
2009
IEEE-ACM
We report on one organization's experience making process changes in a suite of projects. The changes were motivated by clients’ requests for better time estimates, better ...
ICCAD
2008
IEEE
14 years 2 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
SEDE
2007
13 years 7 months ago
2007
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...
ISVLSI
2007
IEEE
14 years 1 days ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
CSMR
2003
IEEE
13 years 11 months ago
2003
IEEE
Testing a distributed system is difficult. Good testing depends on both skill and understanding the system under test. We have developed a method to observe the system at the CORB...