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DATE
2008
IEEE
77views Hardware» more  DATE 2008»
13 years 11 months ago
Re-Examining the Use of Network-on-Chip as Test Access Mechanism
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
Feng Yuan, Lin Huang, Qiang Xu
ET
2002
90views more  ET 2002»
13 years 4 months ago
Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
ET
2010
72views more  ET 2010»
12 years 11 months ago
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism
Ardy van den Berg, Pengwei Ren, Erik Jan Marinisse...
DSD
2010
IEEE
144views Hardware» more  DSD 2010»
13 years 5 months ago
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
DAC
2008
ACM
14 years 5 months ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu