Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...