20 search results - page 1 / 4 » Reducing test data volume using external LBIST hybrid test p... |
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
TVLSI
2010
12 years 11 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...