-- Analog circuit sizing under process/parameter variations is formulated as a mini-max geometric programming problem. To tackle such problem, we present a new method that combines...
The impact of parameter variations in integrated analog circuits is usually analyzed by Monte Carlo methods with a high number of simulation runs. Few approaches based on interval ...
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...
Robert Schwencker, Frank Schenkel, Michael Pronath...
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
Jaskirat Singh, Zhi-Quan Luo, Sachin S. Sapatnekar