14 search results - page 2 / 3 » SAT-based ATPG for Path Delay Faults in Sequential Circuits |
ET
2010
13 years 3 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ASPDAC
2004
ACM
13 years 10 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
1 The first path implicit and exact non–robust path delay fault grading technique for non–scan sequential circuits is presented. Non enumerative exact coverage is obtained, b...
VTS
2007
IEEE
13 years 10 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...