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VTS
2000
IEEE
114views Hardware» more  VTS 2000»
13 years 10 months ago
Detection of CMOS Defects under Variable Processing Conditions
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic
GLVLSI
2003
IEEE
186views VLSI» more  GLVLSI 2003»
13 years 11 months ago
A fast simulation approach for inductive effects of VLSI interconnects
Modeling on-chip inductive effects for interconnects of multigigahertz microprocessors remains challenging. SPICE simulation of these effects is very slow because of the large num...
Xiaoning Qi, Goetz Leonhardt, Daniel Flees, Xiao-D...
ASPDAC
2007
ACM
156views Hardware» more  ASPDAC 2007»
13 years 10 months ago
PLLSim - An Ultra Fast Bang-Bang Phase Locked Loop Simulation Tool
- This paper presents a simulation tool targeted specifically at bang-bang type phase locked loop systems. The aim of this simulator is to quickly and accurately predict important ...
Michael Chan, Adam Postula, Yong Ding
QEST
2005
IEEE
13 years 11 months ago
QBDs with Marked Time Epochs: a Framework for Transient Performance Measures
A framework to assess transient performance measures is introduced by generalizing the theory of the quasi Birthand-Death (QBD) paradigm to QBDs with marked time epochs (QBDm ). T...
Benny Van Houdt, Chris Blondia
TIM
2010
103views Education» more  TIM 2010»
13 years 21 days ago
Analysis of Power Switching Losses Accounting Probe Modeling
Abstract--This paper focuses on the errors affecting the estimation of power switching losses in power semiconductor devices based on integration of the voltage by current product....
Kaiçar Ammous, Hervé Morel, Anis Amm...