23 search results - page 2 / 5 » SRAM parametric failure analysis |
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
In this paper, we develop a method to analyze the probability of access failure in SRAM array (due to random Vt variation in transistors) by jointly considering variations in cell...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
IJFCS
2006
13 years 5 months ago
2006
ion for Parametric Time-Interval Automata Akio Nakata, Tadaaki Tanimoto, Suguru Sasaki, Teruo Higashino Department of Information Networking, Graduate School of Information Science...
IFIP12
2009
13 years 3 months ago
2009
Abstract Early failure detection in motor pumps is an important issue in prediction maintenance. An efficient condition-monitoring scheme is capable of providing warning and predic...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...