94 search results - page 1 / 19 » Scan Compression Implementation in Industrial Design - Case ... |
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
SIGMOD
2007
ACM
14 years 5 months ago
2007
ACM
Two trends are converging to make the CPU cost of a table scan a more important component of database performance. First, table scans are becoming a larger fraction of the query p...