Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muh...
Two trends are converging to make the CPU cost of a table scan a more important component of database performance. First, table scans are becoming a larger fraction of the query p...
Allison L. Holloway, Vijayshankar Raman, Garret Sw...