5 search results - page 1 / 1 » Scheduled voltage scaling for increasing lifetime in the pre... |
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...
ISQED
2011
IEEE
12 years 8 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
ISLPED
2004
ACM
13 years 10 months ago
2004
ACM
Increasing demand for larger high-performance applications requires developing more complex systems with hundreds of processing cores on a single chip. To allow dynamic voltage sc...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
ISPASS
2008
IEEE
13 years 11 months ago
2008
IEEE
The evolution of microprocessors has been hindered by their increasing power consumption and the heat generation speed on-die. High temperature impairs the processor’s reliabili...