13 search results - page 3 / 3 » Signal Integrity: Fault Modeling and Testing in High-Speed S... |
EVOW
2001
Springer
13 years 9 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
CCECE
2006
IEEE
13 years 11 months ago
2006
IEEE
Real Time embedded system designers are facing extreme challenges in underlying architectural design selection. It involves the selection of a programmable, concurrent, heterogene...
ET
2002
13 years 5 months ago
2002
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...