20 search results - page 1 / 4 » Soft Error Hardening for Asynchronous Circuits |
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
ICCD
2008
IEEE
14 years 1 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
JOLPE
2010
13 years 3 months ago
2010
This paper presents a low-power soft error-hardened latch suitable for reliable circuit operation. The proposed circuit uses redundant feedback loop to protect latch against soft e...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...