10 search results - page 1 / 2 » Specification Test Compaction for Analog Circuits and MEMS |
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
ET
2002
13 years 5 months ago
2002
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
CASES
2006
ACM
13 years 11 months ago
2006
ACM
Designers of SoCs with non-digital components, such as analog or MEMS devices, can currently use high-level system design languages, such as SystemC, to model only the digital par...
EURODAC
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
In this paper, we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in th...