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TCAD
2008
115views more  TCAD 2008»
13 years 4 months ago
Statistical Thermal Profile Considering Process Variations: Analysis and Applications
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...
Javid Jaffari, Mohab Anis
DAC
2004
ACM
14 years 6 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw
TCAD
2008
167views more  TCAD 2008»
13 years 4 months ago
System-Level Dynamic Thermal Management for High-Performance Microprocessors
Abstract--Thermal issues are fast becoming major design constraints in high-performance systems. Temperature variations adversely affect system reliability and prompt worst-case de...
Amit Kumar 0002, Li Shang, Li-Shiuan Peh, Niraj K....
TVLSI
2010
12 years 11 months ago
Variation-Aware System-Level Power Analysis
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
Saumya Chandra, Kanishka Lahiri, Anand Raghunathan...
BMCBI
2005
121views more  BMCBI 2005»
13 years 4 months ago
Comparison of seven methods for producing Affymetrix expression scores based on False Discovery Rates in disease profiling data
Background: A critical step in processing oligonucleotide microarray data is combining the information in multiple probes to produce a single number that best captures the express...
Kerby Shedden, Wei Chen, Rork Kuick, Debashis Ghos...