29 search results - page 2 / 6 » Statistical Timing Analysis for Intra-Die Process Variations... |
ISCAS
2005
IEEE
13 years 11 months ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
DAC
2010
ACM
13 years 9 months ago
2010
ACM
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Variability in process parameters is making accurate timing analysis of nano-scale integrated circuits an extremely challenging task. In this paper, we propose a new algorithm for...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, we propose a novel statistical model order reduction technique, called statistical spectrum model order reduction (SSMOR) method, which considers both intra-die and...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
We propose a scalable and efficient parameterized block-based statistical static timing analysis algorithm incorporating both Gaussian and non-Gaussian parameter distributions, ca...