Accurate statistical simulation and modeling are important for IC design. Different types of statistical simulation require different types of statistical models. In this paper a ...
We consider the task of estimating, from observed data, a probabilistic model that is parameterized by a finite number of parameters. In particular, we are considering the situat...
We describe a method for learning statistical models of images using a second-order hidden Markov mesh model. First, an image can be segmented in a way that best matches its stati...
Daniel DeMenthon, David S. Doermann, Marc Vuilleum...
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
Xin Li, Colin C. McAndrew, Weimin Wu, Samir Chaudh...