22 search results - page 2 / 5 » Statistical optimization of leakage power considering proces... |
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper, we propose a novel on-chip voltage drop reduction technique for on-chip power delivery networks of VLSI systems in the presence of variational leakage current sourc...
PATMOS
2007
Springer
13 years 11 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
TCAD
2008
13 years 4 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
TVLSI
2008
13 years 4 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...