Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chan...
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukher...
We propose a false-path-aware statistical timing analysis framework. In our framework, cell as well as interconnect delays are assumed to be correlated random variables. Our tool ...
Effective bug localization is important for realizing automated debugging. One attractive approach is to apply statistical techniques on a collection of evaluation profiles of pr...
This article describes how to implement efficient memory resident path indexes for semi-structured data. Two techniques are introduced, and they are shown to be significantly fas...