20 search results - page 1 / 4 » Survey of Test Vector Compression Techniques |
DT
2006
13 years 5 months ago
2006
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...