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VLSID
1995
IEEE
97views VLSI» more  VLSID 1995»
13 years 8 months ago
Synthesis of asynchronous circuits for stuck-at and robust path delay fault testability
In this paper, we present methods for synthesizing multi-level asynchronous circuits to be both hazard-free
Steven M. Nowick, Niraj K. Jha, Fu-Chiung Cheng
ATS
2003
IEEE
151views Hardware» more  ATS 2003»
13 years 9 months ago
BDD Based Synthesis of Symmetric Functions with Full Path-Delay Fault Testability
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...
Junhao Shi, Görschwin Fey, Rolf Drechsler
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
13 years 8 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
ICCAD
2006
IEEE
126views Hardware» more  ICCAD 2006»
14 years 1 months ago
Exploring linear structures of critical path delay faults to reduce test efforts
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou
VLSI
2005
Springer
13 years 10 months ago
Technology Mapping for Area Optimized Quasi Delay Insensitive Circuits
Quasi delay insensitive circuits are functionally independent of delays in gates and wires (except for some particular wires). Such asynchronous circuits offer high robustness but...
Bertrand Folco, Vivian Brégier, Laurent Fes...