54 search results - page 3 / 11 » System chip test: how will it impact your design |
VLSID
2008
IEEE
14 years 5 days ago
2008
IEEE
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
SIGUCCS
2000
ACM
13 years 10 months ago
2000
ACM
We presented a paper in Denver that addressed our Remedy design process. At that time we talked about our current development process, but we hadn't implemented the product a...
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
HICSS
2006
IEEE
13 years 12 months ago
2006
IEEE
How soon will firms form alliances with a platform provider? What factors impact the decision and the speed with which firms first move into partnerships with a platform provider ...
CASES
2006
ACM
13 years 11 months ago
2006
ACM
Designers of SoCs with non-digital components, such as analog or MEMS devices, can currently use high-level system design languages, such as SystemC, to model only the digital par...