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TVLSI
2008
133views more  TVLSI 2008»
13 years 4 months ago
Test Data Compression Using Selective Encoding of Scan Slices
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
Zhanglei Wang, Krishnendu Chakrabarty
ICCAD
2007
IEEE
135views Hardware» more  ICCAD 2007»
14 years 1 months ago
A selective pattern-compression scheme for power and test-data reduction
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
Chia-Yi Lin, Hung-Ming Chen
DATE
2009
IEEE
94views Hardware» more  DATE 2009»
13 years 11 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
ICCAD
2007
IEEE
109views Hardware» more  ICCAD 2007»
13 years 8 months ago
CacheCompress: a novel approach for test data compression with cache for IP embedded cores
Abstract-- In this paper, we propose a novel test data compression technique named CacheCompress, which combines selective encoding and dynamic dictionary based encoding. Depending...
Hao Fang, Chenguang Tong, Bo Yao, Xiaodi Song, Xu ...
ICCD
2003
IEEE
130views Hardware» more  ICCD 2003»
14 years 1 months ago
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Cha...