5 search results - page 1 / 1 » Test Generation and Diagnostic Test Generation for Open Faul... |
DFT
2007
IEEE
13 years 8 months ago
2007
IEEE
ATS
2009
IEEE
13 years 9 months ago
2009
IEEE
MTDT
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
PTS
1993
13 years 6 months ago
1993
In the area of testing communication systems, the interfaces between systems to be tested and their testers have great impact on test generation and fault detectability. Several t...
TNN
2010
12 years 11 months ago
2010
The weight-decay technique is an effective approach to handle overfitting and weight fault. For fault-free networks, without an appropriate value of decay parameter, the trained ne...