203 search results - page 1 / 41 » Test Generation and Fault Localization for Quantum Circuits |
ISMVL
2005
IEEE
13 years 10 months ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
ET
2010
13 years 2 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
HASE
2007
IEEE
13 years 11 months ago
2007
IEEE
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustr...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...