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ITC
2003
IEEE
120views Hardware» more  ITC 2003»
13 years 10 months ago
Test Vector Generation Based on Correlation Model for Ratio-Iddq
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota
WSC
2007
13 years 7 months ago
A method for fast generation of bivariate Poisson random vectors
It is well known that trivariate reduction — a method to generate two dependent random variables from three independent random variables — can be used to generate Poisson rand...
Kaeyoung Shin, Raghu Pasupathy
JMLR
2011
142views more  JMLR 2011»
12 years 11 months ago
Causal Search in Structural Vector Autoregressive Models
This paper reviews a class of methods to perform causal inference in the framework of a structural vector autoregressive model. We consider three different settings. In the first ...
Alessio Moneta, Nadine Chlass, Doris Entner, Patri...
TVLSI
2008
140views more  TVLSI 2008»
13 years 4 months ago
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Jorge Campos, Hussain Al-Asaad
GLVLSI
2009
IEEE
323views VLSI» more  GLVLSI 2009»
13 years 2 months ago
MYGEN: automata-based on-line test generator for assertion-based verification
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...
Yann Oddos, Katell Morin-Allory, Dominique Borrion...