11 search results - page 2 / 3 » Test coverage and post-verification defects: A multiple case... |
SAC
2005
ACM
13 years 10 months ago
2005
ACM
Regression test prioritization techniques re-order the execution of a test suite in an attempt to ensure that defects are revealed earlier in the test execution phase. In prior wo...
IOLTS
2000
IEEE
13 years 9 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
ISSTA
2009
ACM
13 years 11 months ago
2009
ACM
Metamorphic testing has been shown to be a simple yet effective technique in addressing the quality assurance of applications that do not have test oracles, i.e., for which it is ...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...