112 search results - page 1 / 23 » Test generation in VLSI circuits for crosstalk noise |
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
TCAD
2002
13 years 4 months ago
2002
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...
ICCD
2001
IEEE
14 years 1 months ago
2001
IEEE
Abstract-- Scaling the minimum feature size of VLSI circuits to sub-quarter micron and its clock frequency to 2GHz has caused crosstalk noise to become a serious problem, that degr...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
Pad assignment with signal integrity optimization is very important for high-speed VLSI design. In this paper, an efficient method is proposed to effectively minimize both simulta...